Impact of passivation layer on the subthreshold behavior of p-type CuO accumulation-mode thin-film transistors

Autor:	Chen, Qi, Zeng, Xi, Flandre, Denis
Zdroj:	In Solid State Electronics April 2024 214
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect