Hot-carrier induced degradation of Ge/STI interfaces in Ge-on-Si junction devices
| Autor: | Musibau, Solomon, Franco, Jacopo, Tsiara, Artemisia, De Wolf, Ingrid, Croes, Kristof |
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| Zdroj: | In Solid State Electronics April 2024 214 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect