A novel dual-directional DTSCR in twin-well process for ultra-low-voltage ESD protection

Autor: Gu, Xiaofeng, Xu, Jian, Liang, Hailian, Liu, Junliang, Wang, Dong, Dong, Shurong, Lei, Wen, Liou, Juin J.
Zdroj: In Solid State Electronics February 2024 212
Databáze: ScienceDirect