Modeling and simulation of successive breakdown events in thin gate dielectrics using standard reliability growth models
| Autor: | Miranda, E., Aguirre, F.L., Salvador, E., González, M.B., Campabadal, F., Suñé, J. |
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| Zdroj: | In Solid State Electronics December 2023 210 |
| Databáze: | ScienceDirect |
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