Electrical characterization of SOI pMOS device leakage
Autor: | Bosch, D., Lheritier, P., Guyader, F., Joblot, S., Ponthenier, F., Lacord, J. |
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Zdroj: | In Solid State Electronics October 2023 208 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Bosch, D., Lheritier, P., Guyader, F., Joblot, S., Ponthenier, F., Lacord, J. |
---|---|
Zdroj: | In Solid State Electronics October 2023 208 |
Databáze: | ScienceDirect |
Externí odkaz: |