Electrical characterization of SOI pMOS device leakage
| Autor: | Bosch, D., Lheritier, P., Guyader, F., Joblot, S., Ponthenier, F., Lacord, J. |
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| Zdroj: | In Solid State Electronics October 2023 208 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Bosch, D., Lheritier, P., Guyader, F., Joblot, S., Ponthenier, F., Lacord, J. |
|---|---|
| Zdroj: | In Solid State Electronics October 2023 208 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect