New insights into low frequency noise (LFN) sources analysis in GaN/Si MIS-HEMTs
| Autor: | Kom Kammeugne, R., Theodorou, C., Leroux, C., Vauche, L., Mescot, X., Gwoziecki, R., Becu, S., Charles, M., Bano, E., Ghibaudo, G. |
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| Zdroj: | In Solid State Electronics February 2023 200 |
| Databáze: | ScienceDirect |
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