Effects of Si-doped GaN insert layer in AlGaN/GaN/GaN:Si/AlN DH-HEMT structure

Autor: Jung, Donghyeop, Kim, Minho, Choi, Uiho, Kim, Keono, Nam, Okhyun
Zdroj: In Solid State Electronics January 2023 199
Databáze: ScienceDirect