Reliability improvement of self-heating effect, hot-carrier injection, and on-current variation by electrical/thermal co-design
| Autor: | Suh Song, Young, Yeong Kim, Ki, Young Yoon, Tae, Jung Kang, Seok, Kim, Garam, Kim, Sangwan, Hyun Kim, Jang |
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| Zdroj: | In Solid State Electronics November 2022 197 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect