Scanning Probe Microscopy nanoscale electrical characterization of AlGaN/GaN grown on structured GaN templates
| Autor: | Szyszka, Adam, Wośko, Mateusz, Stafiniak, Andrzej, Prażmowska, Joanna, Paszkiewicz, Regina |
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| Zdroj: | In Solid State Electronics July 2022 193 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect