Electron mobility distribution in FD-SOI MOSFETs using a NEGF-Poisson approach
Autor: | DehdashtiAkhavan, Nima, Antonio Umana-Membreno, Gilberto, Gu, Renjie, Antoszewski, Jarek, Faraone, Lorenzo, Cristoloveanu, Sorin |
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Zdroj: | In Solid State Electronics July 2022 193 |
Databáze: | ScienceDirect |
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