Comprehensive Kubo-Greenwood modelling of FDSOI MOS devices down to deep cryogenic temperatures
| Autor: | Serra di Santa Maria, F., Contamin, L., Cassé, M., Theodorou, C., Balestra, F., Ghibaudo, G. |
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| Zdroj: | In Solid State Electronics June 2022 192 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect