A current model for FOI FinFETs with back-gate bias modulation
| Autor: | Liu, F.Y., Zhang, X., Zhang, F.Y., Li, B., Li, B.H., Huang, Y., Wang, G.Q., Chen, S.Y., Zhang, Q.Z., Yin, H.X., Luo, J.J., Han, Z.S., Guo, Y.F., Cristoloveanu, S. |
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| Zdroj: | In Solid State Electronics November 2021 185 |
| Databáze: | ScienceDirect |
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