Role of temperature, MTJ size and pulse-width on STT-MRAM bit-error rate and backhopping
| Autor: | Tan, J., Lim, J.H., Kwon, J.H., Naik, V.B., Raghavan, N., Pey, K.L. |
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| Zdroj: | In Solid State Electronics September 2021 183 |
| Databáze: | ScienceDirect |
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