In-depth analysis of electrical characteristics for polycrystalline silicon vertical thin film transistors
| Autor: | Zhang, Peng, Jacques, Emmanuel, Rogel, Régis, Pichon, Laurent, Bonnaud, Olivier |
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| Zdroj: | In Solid State Electronics April 2021 178 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect