Abnormal threshold voltage shift by the effect of H2O during negative bias stress in amorphous InGaZnO thin film transistors
| Autor: | Ha, Tae-Kyoung, Kim, Yongjo, Yu, SangHee, Kim, GwangTae, Jeong, Hoon, Park, JeongKi, Kim, Ohyun |
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| Zdroj: | In Solid State Electronics December 2020 174 |
| Databáze: | ScienceDirect |
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