Drain current local variability analysis in nanoscale junctionless FinFETs utilizing a compact model
| Autor: | Oproglidis, T.A., Tassis, D.H., Tsormpatzoglou, A., Ghibaudo, G., Dimitriadis, C.A. |
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| Zdroj: | In Solid State Electronics August 2020 170 |
| Databáze: | ScienceDirect |
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