Scalable compact modeling of trap generation near the EB spacer oxide interface in SiGe HBTs
| Autor: | Couret, Marine, Jaoul, Mathieu, Marc, François, Mukherjee, Chhandak, Céli, Didier, Zimmer, Thomas, Maneux, Cristell |
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| Zdroj: | In Solid State Electronics July 2020 169 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect