Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs
| Autor: | Boudier, D., Cretu, B., Simoen, E., Hellings, G., Schram, T., Mertens, H., Linten, D. |
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| Zdroj: | In Solid State Electronics June 2020 168 |
| Databáze: | ScienceDirect |
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