Improved physics-based analysis to discriminate the flicker noise origin at very low temperature and drain voltage polarization
| Autor: | Cretu, B., Boudier, D., Simoen, E., Veloso, A., Collaert, N., Claeys, C. |
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| Zdroj: | In Solid State Electronics September 2020 171 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect