Improved dielectric properties of BeO thin films grown by plasma enhanced atomic layer deposition

Autor: Jang, Yoonseo, Lee, Seung Min, Jung, Do Hwan, Yum, Jung Hwan, Larsen, Eric S., Bielawski, Christopher W., Oh, Jungwoo
Zdroj: In Solid State Electronics January 2020 163
Databáze: ScienceDirect