Near-field scanning microwave microscope platform based on a coaxial cavity resonator for the characterization of semiconductor structures
| Autor: | Bagdad, Bendehiba Abadlia, Lozano, Carmen, Gamiz, Francisco |
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| Zdroj: | In Solid State Electronics September 2019 159:150-156 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect