Electrostatic Coupling and Identification of Single-Defects in GaN/AlGaN Fin-MIS-HEMTs
| Autor: | Grill, A., Stampfer, B., Im, Ki-Sik, Lee, J.-H., Ostermaier, C., Ceric, H., Waltl, M., Grasser, T. |
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| Zdroj: | In Solid State Electronics June 2019 156:41-47 |
| Databáze: | ScienceDirect |
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