Universal model of bias-stress-induced instability in inkjet-printed carbon nanotube networks field-effect transistors
| Autor: | Jung, Haesun, Choi, Sungju, Jang, Jun Tae, Yoon, Jinsu, Lee, Juhee, Lee, Yongwoo, Rhee, Jihyun, Ahn, Geumho, Yu, Hye Ri, Kim, Dong Myong, Choi, Sung-Jin, Kim, Dae Hwan |
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| Zdroj: | In Solid State Electronics February 2018 140:80-85 |
| Databáze: | ScienceDirect |
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