Static and low frequency noise characterization of ultra-thin body InAs MOSFETs
| Autor: | Karatsori, T.A., Pastorek, M., Theodorou, C.G., Fadjie, A., Wichmann, N., Desplanque, L., Wallart, X., Bollaert, S., Dimitriadis, C.A., Ghibaudo, G. |
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| Zdroj: | In Solid State Electronics May 2018 143:56-61 |
| Databáze: | ScienceDirect |
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