Abnormal behavior with hump characteristics in current stressed a-InGaZnO thin film transistors
| Autor: | Kim, Woo-Sic, Cho, Yong-Jung, Lee, Yeol-Hyeong, Park, JeongKi, Kim, GeonTae, Kim, Ohyun |
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| Zdroj: | In Solid State Electronics November 2017 137:22-28 |
| Databáze: | ScienceDirect |
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