Elimination of the channel current effect on the characterization of MOSFET threshold voltage using junction capacitance measurements
| Autor: | Tomaszewski, Daniel, Głuszko, Grzegorz, Łukasiak, Lidia, Kucharski, Krzysztof, Malesińska, Jolanta |
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| Zdroj: | In Solid State Electronics February 2017 128:92-101 |
| Databáze: | ScienceDirect |
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