Effect of depth of traps in ZnO polycrystalline thin films on ZnO-TFTs performance

Autor: Medina-Montes, Maria I., Baldenegro-Perez, Leonardo A., Sanchez-Zeferino, Raul, Rojas-Blanco, Lizeth, Becerril-Silva, Marcelino, Quevedo-Lopez, Manuel A., Ramirez-Bon, Rafael
Zdroj: In Solid State Electronics September 2016 123:119-123
Databáze: ScienceDirect