Effect of depth of traps in ZnO polycrystalline thin films on ZnO-TFTs performance
Autor: | Medina-Montes, Maria I., Baldenegro-Perez, Leonardo A., Sanchez-Zeferino, Raul, Rojas-Blanco, Lizeth, Becerril-Silva, Marcelino, Quevedo-Lopez, Manuel A., Ramirez-Bon, Rafael |
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Zdroj: | In Solid State Electronics September 2016 123:119-123 |
Databáze: | ScienceDirect |
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