Evolution of the gate current in 32 nm MOSFETs under irradiation
| Autor: | Palumbo, F., Debray, M., Vega, N., Quinteros, C., Kalstein, A., Guarin, F. |
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| Zdroj: | In Solid State Electronics May 2016 119:19-24 |
| Databáze: | ScienceDirect |
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| Autor: | Palumbo, F., Debray, M., Vega, N., Quinteros, C., Kalstein, A., Guarin, F. |
|---|---|
| Zdroj: | In Solid State Electronics May 2016 119:19-24 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect