Ultra-thin body & buried oxide SOI substrate development and qualification for Fully Depleted SOI device with back bias capability

Autor: Schwarzenbach, Walter, Nguyen, Bich-Yen, Allibert, Frederic, Girard, Christophe, Maleville, Christophe
Zdroj: In Solid State Electronics March 2016 117:2-9
Databáze: ScienceDirect