Replacement fin processing for III–V on Si: From FinFets to nanowires

Autor: Waldron, Niamh, Merckling, Clement, Teugels, Lieve, Ong, Patrick, Sebaai, Farid, Barla, Kathy, Collaert, Nadine, Thean, Voon-Yew (Aaron)
Zdroj: In Solid State Electronics January 2016 115 Part B:81-91
Databáze: ScienceDirect