Comparison of self-heating and its effect on analogue performance in 28 nm bulk and FDSOI
| Autor: | Makovejev, S., Planes, N., Haond, M., Flandre, D., Raskin, J.-P., Kilchytska, V. |
|---|---|
| Zdroj: | In Solid State Electronics January 2016 115 Part B:219-224 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect