New high resolution Random Telegraph Noise (RTN) characterization method for resistive RAM
| Autor: | Maestro, M., Diaz, J., Crespo-Yepes, A., Gonzalez, M.B., Martin-Martinez, J., Rodriguez, R., Nafria, M., Campabadal, F., Aymerich, X. |
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| Zdroj: | In Solid State Electronics January 2016 115 Part B:140-145 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect