Full gate voltage range Lambert-function based methodology for FDSOI MOSFET parameter extraction

Autor: Karatsori, T.A., Theodorou, C.G., Ioannidis, E.G., Haendler, S., Josse, E., Dimitriadis, C.A., Ghibaudo, G.
Zdroj: In Solid State Electronics September 2015 111:123-128
Databáze: ScienceDirect