Self-consistent simulation on multiple activation energy of retention characteristics in charge trapping flash memory
Autor: | Park, Sangyong, Choi, Seongwook, Jun, Kwang Sun, Kim, HuiJung, Rhee, SungMan, Park, Young June |
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Zdroj: | In Solid State Electronics November 2015 113:144-150 |
Databáze: | ScienceDirect |
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