Electrical characterization of p-GeSn/n-Ge diodes with interface traps under dc and ac regimes
| Autor: | Baert, B., Gupta, S., Gencarelli, F., Loo, R., Simoen, E., Nguyen, N.D. |
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| Zdroj: | In Solid State Electronics August 2015 110:65-70 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect