Low temperature characterization of mobility in 14 nm FD-SOI CMOS devices under interface coupling conditions
| Autor: | Shin, Minju, Shi, Ming, Mouis, Mireille, Cros, Antoine, Josse, Emmanuel, Kim, Gyu-Tae, Ghibaudo, Gérard |
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| Zdroj: | In Solid State Electronics June 2015 108:30-35 |
| Databáze: | ScienceDirect |
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