Analysis of trap distribution in polysilicon channel transistors using the variable amplitude charge pumping method
Autor: | Nguyen, Manh-Cuong, Jeon, Yoon-Seok, Tong, Duc-Tai, You, Seung-Won, Jeong, Jae-Kyeong, Kim, Bio, Ahn, Jae-young, Hwang, Kihyun, Choi, Rino |
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Zdroj: | In Solid State Electronics February 2015 104:86-89 |
Databáze: | ScienceDirect |
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