Analysis of trap distribution in polysilicon channel transistors using the variable amplitude charge pumping method

Autor: Nguyen, Manh-Cuong, Jeon, Yoon-Seok, Tong, Duc-Tai, You, Seung-Won, Jeong, Jae-Kyeong, Kim, Bio, Ahn, Jae-young, Hwang, Kihyun, Choi, Rino
Zdroj: In Solid State Electronics February 2015 104:86-89
Databáze: ScienceDirect