Magnetoresistance mobility characterization in advanced FD-SOI n-MOSFETs

Autor: Shin, Minju, Shi, Ming, Mouis, Mireille, Cros, Antoine, Josse, Emmanuel, Mukhopadhyay, Sutirha, Piot, Benjamin, Kim, Gyu-Tae, Ghibaudo, Gérard
Zdroj: In Solid State Electronics January 2015 103:229-235
Databáze: ScienceDirect