Full split C–V method for parameter extraction in ultra thin BOX FDSOI MOS devices

Autor: Shin, Minju, Shi, Ming, Mouis, Mireille, Cros, Antoine, Josse, Emmanuel, Kim, Gyu-Tae, Ghibaudo, Gérard
Zdroj: In Solid State Electronics September 2014 99:104-107
Databáze: ScienceDirect