Low rate deep level transient spectroscopy - a powerful tool for defect characterization in wide bandgap semiconductors
| Autor: | Schmidt, Florian, von Wenckstern, Holger, Breitenstein, Otwin, Pickenhain, Rainer, Grundmann, Marius |
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| Zdroj: | In Solid State Electronics February 2014 92:40-46 |
| Databáze: | ScienceDirect |
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