A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuits
| Autor: | Esqueda, Ivan S., Barnaby, Hugh J. |
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| Zdroj: | In Solid State Electronics January 2014 91:81-86 |
| Databáze: | ScienceDirect |
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| Autor: | Esqueda, Ivan S., Barnaby, Hugh J. |
|---|---|
| Zdroj: | In Solid State Electronics January 2014 91:81-86 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect