Automatic parameter extraction technique for gate leakage current modeling in double gate MOSFET
| Autor: | Darbandy, Ghader, Gneiting, Thomas, Alius, Heidrun, Alvarado, Joaquín, Cerdeira, Antonio, Iñiguez, Benjamin |
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| Zdroj: | In Solid State Electronics November 2013 89:111-115 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect