Analysis of trap-assisted tunneling in vertical Si homo-junction and SiGe hetero-junction Tunnel-FETs
| Autor: | Vandooren, A., Leonelli, D., Rooyackers, R., Hikavyy, A., Devriendt, K., Demand, M., Loo, R., Groeseneken, G., Huyghebaert, C. |
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| Zdroj: | In Solid State Electronics May 2013 83:50-55 |
| Databáze: | ScienceDirect |
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