Data retention under gate stress on a NVM array
| Autor: | Djenadi, R., Micolau, G., Postel-Pellerin, J., Chiquet, P., Laffont, R., Ogier, J.-L., Regnier, A., Lalande, F., Melkonian, J. |
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| Zdroj: | In Solid State Electronics December 2012 78:80-86 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect