Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices
| Autor: | Maconi, A., Arreghini, A., Monzio Compagnoni, C., Van den bosch, G., Spinelli, A.S., Van Houdt, J., Lacaita, A.L. |
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| Zdroj: | In Solid State Electronics August 2012 74:64-70 |
| Databáze: | ScienceDirect |
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