Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations
| Autor: | Nazir, Aftab, Eyben, Pierre, Clarysse, Trudo, Hellings, Geert, Schulze, Andreas, Mody, Jay, De Meyer, Kristin, Bender, Hugo, Vandervorst, Wilfried |
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| Zdroj: | In Solid State Electronics August 2012 74:38-42 |
| Databáze: | ScienceDirect |
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