Characterization and analysis of electrical trap related effects on the reliability of AlGaN/GaN HEMTs
| Autor: | Berthet, Fanny, Guhel, Yannick, Gualous, Hamid, Boudart, Bertrand, Trolet, Jean-Lionel, Piccione, Marc, Sbrugnera, Vanessa, Grimbert, Bertrand, Gaquière, Christophe |
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| Zdroj: | In Solid State Electronics June 2012 72:15-21 |
| Databáze: | ScienceDirect |
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