Analysis and optimisation of lateral thin-film silicon-on-insulator (SOI) PMOS transistor with an NBL layer in the drift region

Autor: Cortés, I., Toulon, G., Morancho, F., Flores, D., Hugonnard-Bruyère, E., Villard, B.
Zdroj: In Solid State Electronics April 2012 70:8-13
Databáze: ScienceDirect