Study of annealing temperature influence on the performance of top gated graphene/SiC transistors

Autor: Clavel, M., Poiroux, T., Mouis, M., Becerra, L., Thomassin, J.L., Zenasni, A., Lapertot, G., Rouchon, D., Lafond, D., Faynot, O.
Zdroj: In Solid State Electronics May 2012 71:2-6
Databáze: ScienceDirect