Four-point probe characterization of 4H silicon carbide
| Autor: | Chandra, N., Sharma, V., Chung, G.Y., Schroder, D.K. |
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| Zdroj: | In Solid State Electronics 2011 64(1):73-77 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Chandra, N., Sharma, V., Chung, G.Y., Schroder, D.K. |
|---|---|
| Zdroj: | In Solid State Electronics 2011 64(1):73-77 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect